X-Ray Diffraction Line Shifts in the Debye-Scherrer Pattern from Wire Specimens with Preferred Orientation

In solid metal samples which have a strong texture, certain planes will favor the diffraction of the vertically divergent rays of the x-ray beam more than the parallel rays. In extreme cases this will produce a diffraction peak shift. The direction and magnitude of the shift obtained from a specimen with a prominent 〈001〉 wire texture is in good agreement with the theoretical calculations of Pike (1957).