Demonstration of a 256×256 middle-wavelength infrared focal plane array based on InGaAs/InGaP quantum dot infrared photodetectors

We report a demonstration of an infrared focal plane array based on InGaAs/InGaP quantum dot infrared photodetectors. The middle-wavelength infrared quantum-dot infrared photodetector (QDIP) structure was grown via low-pressure metal organic chemical vapor deposition. A detectivity of 3.6×1010 cm Hz...

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Veröffentlicht in:Applied physics letters 2004-03, Vol.84 (13), p.2232-2234
Hauptverfasser: Jiang, J., Mi, K., Tsao, S., Zhang, W., Lim, H., O’Sullivan, T., Sills, T., Razeghi, M., Brown, G. J., Tidrow, M. Z.
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Sprache:eng
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Zusammenfassung:We report a demonstration of an infrared focal plane array based on InGaAs/InGaP quantum dot infrared photodetectors. The middle-wavelength infrared quantum-dot infrared photodetector (QDIP) structure was grown via low-pressure metal organic chemical vapor deposition. A detectivity of 3.6×1010 cm Hz1/2/W was achieved at T=95 K and a bias of −1.4 V. The background limited temperature of our QDIP was 140 K with a 45° field of view. A 256×256 detector array was fabricated with dry etching, and hybridized to a Litton readout chip by indium bumps. Thermal imaging was achieved at temperatures up to 120 K. At T=77 K, the noise equivalent temperature difference was measured as 0.509 K with a 300 K background and f/2.3 optics.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.1688000