Measurement of the effective electron mass in GaInNAs by energy-loss spectroscopy
Imaging of the electronic structure of a GaInNAs/GaAs quantum well has been investigated by mapping the variation in the plasmon frequency using an electron energy-loss spectrometer on a dedicated field emission gun scanning transmission electron microscope. Kramers–Kronig analysis of the single sca...
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Veröffentlicht in: | Applied physics letters 2004-03, Vol.84 (9), p.1453-1455 |
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Hauptverfasser: | , , , , |
Format: | Artikel |
Sprache: | eng |
Online-Zugang: | Volltext |
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Zusammenfassung: | Imaging of the electronic structure of a GaInNAs/GaAs quantum well has been investigated by mapping the variation in the plasmon frequency using an electron energy-loss spectrometer on a dedicated field emission gun scanning transmission electron microscope. Kramers–Kronig analysis of the single scattered low-loss region yields a measure of the joint effective valence electron density. The average electron density has been used to provide a direct measurement of the electron effective mass of GaInNAs. The reduced mass was found to be 0.0874m0 for a 7 nm thick Ga0.9In0.1N0.04As0.96 quantum well. |
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ISSN: | 0003-6951 1077-3118 |
DOI: | 10.1063/1.1650906 |