Measurement of the effective electron mass in GaInNAs by energy-loss spectroscopy

Imaging of the electronic structure of a GaInNAs/GaAs quantum well has been investigated by mapping the variation in the plasmon frequency using an electron energy-loss spectrometer on a dedicated field emission gun scanning transmission electron microscope. Kramers–Kronig analysis of the single sca...

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Veröffentlicht in:Applied physics letters 2004-03, Vol.84 (9), p.1453-1455
Hauptverfasser: Gass, M. H., Papworth, A. J., Joyce, T. B., Bullough, T. J., Chalker, P. R.
Format: Artikel
Sprache:eng
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Zusammenfassung:Imaging of the electronic structure of a GaInNAs/GaAs quantum well has been investigated by mapping the variation in the plasmon frequency using an electron energy-loss spectrometer on a dedicated field emission gun scanning transmission electron microscope. Kramers–Kronig analysis of the single scattered low-loss region yields a measure of the joint effective valence electron density. The average electron density has been used to provide a direct measurement of the electron effective mass of GaInNAs. The reduced mass was found to be 0.0874m0 for a 7 nm thick Ga0.9In0.1N0.04As0.96 quantum well.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.1650906