Optical gain, carrier-induced phase shift, and linewidth enhancement factor in InGaN quantum well lasers

Adapting the Hakki Paoli method to group III nitrides, we measure gain, differential gain, carrier-induced change of refractive index, carrier-induced phase shift, and the antiguiding factor. Our measurements also cover the low-carrier-density regime, in which spontaneous and piezoelectric fields an...

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Veröffentlicht in:Applied physics letters 2003-11, Vol.83 (20), p.4095-4097
Hauptverfasser: Schwarz, U. T., Sturm, E., Wegscheider, W., Kümmler, V., Lell, A., Härle, V.
Format: Artikel
Sprache:eng
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Zusammenfassung:Adapting the Hakki Paoli method to group III nitrides, we measure gain, differential gain, carrier-induced change of refractive index, carrier-induced phase shift, and the antiguiding factor. Our measurements also cover the low-carrier-density regime, in which spontaneous and piezoelectric fields and Coulomb interaction are only partially screened. This regime is most interesting as a comparison with existing theoretical simulations, including many-body effects.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.1628825