Infrared dielectric functions and phonon modes of wurtzite MgxZn1−xO (x⩽0.2)

Infrared dielectric function spectra and phonon modes with polarization parallel and perpendicular to the c axis of high quality, highly relaxed, and single crystalline wurtzite MgxZn1−xO films with 0⩽x⩽0.2 prepared by pulsed-laser deposition on c-plane sapphire substrates were obtained from infrare...

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Veröffentlicht in:Applied physics letters 2002-09, Vol.81 (13), p.2376-2378
Hauptverfasser: Bundesmann, C., Schubert, M., Spemann, D., Butz, T., Lorenz, M., Kaidashev, E. M., Grundmann, M., Ashkenov, N., Neumann, H., Wagner, G.
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Sprache:eng
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Zusammenfassung:Infrared dielectric function spectra and phonon modes with polarization parallel and perpendicular to the c axis of high quality, highly relaxed, and single crystalline wurtzite MgxZn1−xO films with 0⩽x⩽0.2 prepared by pulsed-laser deposition on c-plane sapphire substrates were obtained from infrared spectroscopic ellipsometry (380–1200 cm−1) and Raman scattering studies. A two-mode behavior is found for the modes with E1 symmetry, a lattice mode and an impurity-type mode are obtained for the A1 symmetry phonons. Model dielectric function spectra will become useful for future infrared ellipsometry analysis of complex MgxZn1−xO-based heterostructures.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.1509862