Combined optical and spatial modulation THz-spectroscopy for the analysis of thin-layered systems
We present a combined optical and spatial modulation technique to enhance drastically the resolution threshold of time-domain THz spectroscopy. By this approach, relative changes of THz transmission can be resolved down to unprecedented values of −90 dB, enabling the broadband analysis of extremely...
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| Veröffentlicht in: | Applied physics letters 2002-09, Vol.81 (10), p.1791-1793 |
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| Hauptverfasser: | , , |
| Format: | Artikel |
| Sprache: | eng |
| Online-Zugang: | Volltext |
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| Zusammenfassung: | We present a combined optical and spatial modulation technique to enhance drastically the resolution threshold of time-domain THz spectroscopy. By this approach, relative changes of THz transmission can be resolved down to unprecedented values of −90 dB, enabling the broadband analysis of extremely thin layered systems. The system capabilities are demonstrated by characterizing dielectric films, specifically a 1.2 μm thick polymer and a 100 nm thick SiO2 film. |
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| ISSN: | 0003-6951 1077-3118 |
| DOI: | 10.1063/1.1505118 |