Electro-optic detection of subwavelength terahertz spot sizes in the near field of a metal tip

We report on a method to obtain a subwavelength resolution in terahertz time-domain imaging. In our method, a sharp copper tip is used to locally distort and concentrate the THz electric field. The distorted electric field, present mainly in the near field of the tip, is electro-optically measured i...

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Veröffentlicht in:Applied physics letters 2002-08, Vol.81 (9), p.1558-1560
Hauptverfasser: van der Valk, N. C. J., Planken, P. C. M.
Format: Artikel
Sprache:eng
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Zusammenfassung:We report on a method to obtain a subwavelength resolution in terahertz time-domain imaging. In our method, a sharp copper tip is used to locally distort and concentrate the THz electric field. The distorted electric field, present mainly in the near field of the tip, is electro-optically measured in an (100) oriented GaP crystal. By raster scanning the tip along the surface of the crystal, we find the smallest THz spot size of 18 μm for frequencies from 0.1 to 2.5 THz. For our peak frequency of 0.15 THz, this corresponds to a resolution of λ/110. Our setup has the potential to reach a resolution down to a few μm.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.1503404