X-ray scattering microscope with a Wolter mirror

X-ray scattering microscope with a Wolter mirror

Full-field x-ray scattering microscopic images were obtained with a Wolter mirror (×10 magnification). A synchrotron radiation white beam (4–20 keV) from a bending magnet beamline at the Photon Factory was used to obtain x-ray scattering images. The system was available for multi-kilo-electron-volt...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Review of scientific instruments 2002-07, Vol.73 (7), p.2629-2633
Hauptverfasser: Takano, Hidekazu, Aoki, Sadao, Kumegawa, Masaru, Watanabe, Norio, Ohhigashi, Takuji, Aota, Tatsuya, Yamamoto, Kimitake, Yokosuka, Hiroki, Tanoue, Ryuichi, Tsujita, Yuji, Ando, Masami
Format: Artikel
Sprache:eng
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 2633
container_issue 7
container_start_page 2629
container_title Review of scientific instruments
container_volume 73
creator Takano, Hidekazu
Aoki, Sadao
Kumegawa, Masaru
Watanabe, Norio
Ohhigashi, Takuji
Aota, Tatsuya
Yamamoto, Kimitake
Yokosuka, Hiroki
Tanoue, Ryuichi
Tsujita, Yuji
Ando, Masami
description Full-field x-ray scattering microscopic images were obtained with a Wolter mirror (×10 magnification). A synchrotron radiation white beam (4–20 keV) from a bending magnet beamline at the Photon Factory was used to obtain x-ray scattering images. The system was available for multi-kilo-electron-volt x-ray range (4–12 keV) with the Wolter mirror. The image was formed only with scattered x rays from the object, which is kind of a dark-field image. Very low absorptive materials could be imaged with this microscope. Sensitivity of the system was evaluated and also the detection limit was estimated.
doi_str_mv 10.1063/1.1487888
format Article
fullrecord <record><control><sourceid>scitation_cross</sourceid><recordid>TN_cdi_crossref_primary_10_1063_1_1487888</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>rsi</sourcerecordid><originalsourceid>FETCH-LOGICAL-c297t-2847ec01f10d410249132c617e7e75c3cdb1e14433775dc7aa7fa9b0b673f47a3</originalsourceid><addsrcrecordid>eNqdj09LxDAQxYMoWFcPfoNeFbLONGknPcriP1jwougtpGmqkd1NSYKy394uu-DdeYc5vB-P9xi7RJgjNOIG5ygVKaWOWIGgWk5NJY5ZASAkb0iqU3aW0hdMVyMWDN55NNsyWZOzi37zUa69jSHZMLryx-fP0pRvYTV5kxFjiOfsZDCr5C4Of8Ze7-9eFo98-fzwtLhdclu1lHmlJDkLOCD0EqGSLYrKNkhuUm2F7Tt0KKUQRHVvyRgaTNtB15AYJBkxY1f73F2bFN2gx-jXJm41gt5N1agPUyf2es8m67PJPmz-B3-H-AfqsR_EL4ymYRs</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>X-ray scattering microscope with a Wolter mirror</title><source>AIP Journals Complete</source><source>AIP Digital Archive</source><creator>Takano, Hidekazu ; Aoki, Sadao ; Kumegawa, Masaru ; Watanabe, Norio ; Ohhigashi, Takuji ; Aota, Tatsuya ; Yamamoto, Kimitake ; Yokosuka, Hiroki ; Tanoue, Ryuichi ; Tsujita, Yuji ; Ando, Masami</creator><creatorcontrib>Takano, Hidekazu ; Aoki, Sadao ; Kumegawa, Masaru ; Watanabe, Norio ; Ohhigashi, Takuji ; Aota, Tatsuya ; Yamamoto, Kimitake ; Yokosuka, Hiroki ; Tanoue, Ryuichi ; Tsujita, Yuji ; Ando, Masami</creatorcontrib><description>Full-field x-ray scattering microscopic images were obtained with a Wolter mirror (×10 magnification). A synchrotron radiation white beam (4–20 keV) from a bending magnet beamline at the Photon Factory was used to obtain x-ray scattering images. The system was available for multi-kilo-electron-volt x-ray range (4–12 keV) with the Wolter mirror. The image was formed only with scattered x rays from the object, which is kind of a dark-field image. Very low absorptive materials could be imaged with this microscope. Sensitivity of the system was evaluated and also the detection limit was estimated.</description><identifier>ISSN: 0034-6748</identifier><identifier>EISSN: 1089-7623</identifier><identifier>DOI: 10.1063/1.1487888</identifier><identifier>CODEN: RSINAK</identifier><language>eng</language><ispartof>Review of scientific instruments, 2002-07, Vol.73 (7), p.2629-2633</ispartof><rights>American Institute of Physics</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c297t-2847ec01f10d410249132c617e7e75c3cdb1e14433775dc7aa7fa9b0b673f47a3</citedby><cites>FETCH-LOGICAL-c297t-2847ec01f10d410249132c617e7e75c3cdb1e14433775dc7aa7fa9b0b673f47a3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://pubs.aip.org/rsi/article-lookup/doi/10.1063/1.1487888$$EHTML$$P50$$Gscitation$$H</linktohtml><link.rule.ids>314,776,780,790,1553,4498,27901,27902,76126,76132</link.rule.ids></links><search><creatorcontrib>Takano, Hidekazu</creatorcontrib><creatorcontrib>Aoki, Sadao</creatorcontrib><creatorcontrib>Kumegawa, Masaru</creatorcontrib><creatorcontrib>Watanabe, Norio</creatorcontrib><creatorcontrib>Ohhigashi, Takuji</creatorcontrib><creatorcontrib>Aota, Tatsuya</creatorcontrib><creatorcontrib>Yamamoto, Kimitake</creatorcontrib><creatorcontrib>Yokosuka, Hiroki</creatorcontrib><creatorcontrib>Tanoue, Ryuichi</creatorcontrib><creatorcontrib>Tsujita, Yuji</creatorcontrib><creatorcontrib>Ando, Masami</creatorcontrib><title>X-ray scattering microscope with a Wolter mirror</title><title>Review of scientific instruments</title><description>Full-field x-ray scattering microscopic images were obtained with a Wolter mirror (×10 magnification). A synchrotron radiation white beam (4–20 keV) from a bending magnet beamline at the Photon Factory was used to obtain x-ray scattering images. The system was available for multi-kilo-electron-volt x-ray range (4–12 keV) with the Wolter mirror. The image was formed only with scattered x rays from the object, which is kind of a dark-field image. Very low absorptive materials could be imaged with this microscope. Sensitivity of the system was evaluated and also the detection limit was estimated.</description><issn>0034-6748</issn><issn>1089-7623</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2002</creationdate><recordtype>article</recordtype><recordid>eNqdj09LxDAQxYMoWFcPfoNeFbLONGknPcriP1jwougtpGmqkd1NSYKy394uu-DdeYc5vB-P9xi7RJgjNOIG5ygVKaWOWIGgWk5NJY5ZASAkb0iqU3aW0hdMVyMWDN55NNsyWZOzi37zUa69jSHZMLryx-fP0pRvYTV5kxFjiOfsZDCr5C4Of8Ze7-9eFo98-fzwtLhdclu1lHmlJDkLOCD0EqGSLYrKNkhuUm2F7Tt0KKUQRHVvyRgaTNtB15AYJBkxY1f73F2bFN2gx-jXJm41gt5N1agPUyf2es8m67PJPmz-B3-H-AfqsR_EL4ymYRs</recordid><startdate>200207</startdate><enddate>200207</enddate><creator>Takano, Hidekazu</creator><creator>Aoki, Sadao</creator><creator>Kumegawa, Masaru</creator><creator>Watanabe, Norio</creator><creator>Ohhigashi, Takuji</creator><creator>Aota, Tatsuya</creator><creator>Yamamoto, Kimitake</creator><creator>Yokosuka, Hiroki</creator><creator>Tanoue, Ryuichi</creator><creator>Tsujita, Yuji</creator><creator>Ando, Masami</creator><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>200207</creationdate><title>X-ray scattering microscope with a Wolter mirror</title><author>Takano, Hidekazu ; Aoki, Sadao ; Kumegawa, Masaru ; Watanabe, Norio ; Ohhigashi, Takuji ; Aota, Tatsuya ; Yamamoto, Kimitake ; Yokosuka, Hiroki ; Tanoue, Ryuichi ; Tsujita, Yuji ; Ando, Masami</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c297t-2847ec01f10d410249132c617e7e75c3cdb1e14433775dc7aa7fa9b0b673f47a3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2002</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Takano, Hidekazu</creatorcontrib><creatorcontrib>Aoki, Sadao</creatorcontrib><creatorcontrib>Kumegawa, Masaru</creatorcontrib><creatorcontrib>Watanabe, Norio</creatorcontrib><creatorcontrib>Ohhigashi, Takuji</creatorcontrib><creatorcontrib>Aota, Tatsuya</creatorcontrib><creatorcontrib>Yamamoto, Kimitake</creatorcontrib><creatorcontrib>Yokosuka, Hiroki</creatorcontrib><creatorcontrib>Tanoue, Ryuichi</creatorcontrib><creatorcontrib>Tsujita, Yuji</creatorcontrib><creatorcontrib>Ando, Masami</creatorcontrib><collection>CrossRef</collection><jtitle>Review of scientific instruments</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Takano, Hidekazu</au><au>Aoki, Sadao</au><au>Kumegawa, Masaru</au><au>Watanabe, Norio</au><au>Ohhigashi, Takuji</au><au>Aota, Tatsuya</au><au>Yamamoto, Kimitake</au><au>Yokosuka, Hiroki</au><au>Tanoue, Ryuichi</au><au>Tsujita, Yuji</au><au>Ando, Masami</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>X-ray scattering microscope with a Wolter mirror</atitle><jtitle>Review of scientific instruments</jtitle><date>2002-07</date><risdate>2002</risdate><volume>73</volume><issue>7</issue><spage>2629</spage><epage>2633</epage><pages>2629-2633</pages><issn>0034-6748</issn><eissn>1089-7623</eissn><coden>RSINAK</coden><abstract>Full-field x-ray scattering microscopic images were obtained with a Wolter mirror (×10 magnification). A synchrotron radiation white beam (4–20 keV) from a bending magnet beamline at the Photon Factory was used to obtain x-ray scattering images. The system was available for multi-kilo-electron-volt x-ray range (4–12 keV) with the Wolter mirror. The image was formed only with scattered x rays from the object, which is kind of a dark-field image. Very low absorptive materials could be imaged with this microscope. Sensitivity of the system was evaluated and also the detection limit was estimated.</abstract><doi>10.1063/1.1487888</doi><tpages>5</tpages></addata></record>
fulltext fulltext
identifier ISSN: 0034-6748
ispartof Review of scientific instruments, 2002-07, Vol.73 (7), p.2629-2633
issn 0034-6748
1089-7623
language eng
recordid cdi_crossref_primary_10_1063_1_1487888
source AIP Journals Complete; AIP Digital Archive
title X-ray scattering microscope with a Wolter mirror
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-09T02%3A49%3A11IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-scitation_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=X-ray%20scattering%20microscope%20with%20a%20Wolter%20mirror&rft.jtitle=Review%20of%20scientific%20instruments&rft.au=Takano,%20Hidekazu&rft.date=2002-07&rft.volume=73&rft.issue=7&rft.spage=2629&rft.epage=2633&rft.pages=2629-2633&rft.issn=0034-6748&rft.eissn=1089-7623&rft.coden=RSINAK&rft_id=info:doi/10.1063/1.1487888&rft_dat=%3Cscitation_cross%3Ersi%3C/scitation_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true