X-ray scattering microscope with a Wolter mirror

Full-field x-ray scattering microscopic images were obtained with a Wolter mirror (×10 magnification). A synchrotron radiation white beam (4–20 keV) from a bending magnet beamline at the Photon Factory was used to obtain x-ray scattering images. The system was available for multi-kilo-electron-volt...

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Veröffentlicht in:Review of scientific instruments 2002-07, Vol.73 (7), p.2629-2633
Hauptverfasser: Takano, Hidekazu, Aoki, Sadao, Kumegawa, Masaru, Watanabe, Norio, Ohhigashi, Takuji, Aota, Tatsuya, Yamamoto, Kimitake, Yokosuka, Hiroki, Tanoue, Ryuichi, Tsujita, Yuji, Ando, Masami
Format: Artikel
Sprache:eng
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Zusammenfassung:Full-field x-ray scattering microscopic images were obtained with a Wolter mirror (×10 magnification). A synchrotron radiation white beam (4–20 keV) from a bending magnet beamline at the Photon Factory was used to obtain x-ray scattering images. The system was available for multi-kilo-electron-volt x-ray range (4–12 keV) with the Wolter mirror. The image was formed only with scattered x rays from the object, which is kind of a dark-field image. Very low absorptive materials could be imaged with this microscope. Sensitivity of the system was evaluated and also the detection limit was estimated.
ISSN:0034-6748
1089-7623
DOI:10.1063/1.1487888