X-ray scattering microscope with a Wolter mirror
Full-field x-ray scattering microscopic images were obtained with a Wolter mirror (×10 magnification). A synchrotron radiation white beam (4–20 keV) from a bending magnet beamline at the Photon Factory was used to obtain x-ray scattering images. The system was available for multi-kilo-electron-volt...
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Veröffentlicht in: | Review of scientific instruments 2002-07, Vol.73 (7), p.2629-2633 |
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Hauptverfasser: | , , , , , , , , , , |
Format: | Artikel |
Sprache: | eng |
Online-Zugang: | Volltext |
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Zusammenfassung: | Full-field x-ray scattering microscopic images were obtained with a Wolter mirror (×10 magnification). A synchrotron radiation white beam (4–20 keV) from a bending magnet beamline at the Photon Factory was used to obtain x-ray scattering images. The system was available for multi-kilo-electron-volt x-ray range (4–12 keV) with the Wolter mirror. The image was formed only with scattered x rays from the object, which is kind of a dark-field image. Very low absorptive materials could be imaged with this microscope. Sensitivity of the system was evaluated and also the detection limit was estimated. |
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ISSN: | 0034-6748 1089-7623 |
DOI: | 10.1063/1.1487888 |