Submicron YBa2Cu3Ox ramp Josephson junctions
Submicron YBa2Cu3Ox/PrBa2Cu2.6Ga0.4Ox/YBa2Cu3Ox ramp-type Josephson junctions were fabricated and tested. The submicron bridges in the top electrode were patterned by e-beam lithography and Ar ion milling through an amorphous carbon (a-C) mask. Junctions with width ranging from 0.2 to 8 μm and orien...
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Veröffentlicht in: | Applied physics letters 2002-02, Vol.80 (6), p.1022-1024 |
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Hauptverfasser: | , , , |
Format: | Artikel |
Sprache: | eng |
Online-Zugang: | Volltext |
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Zusammenfassung: | Submicron YBa2Cu3Ox/PrBa2Cu2.6Ga0.4Ox/YBa2Cu3Ox ramp-type Josephson junctions were fabricated and tested. The submicron bridges in the top electrode were patterned by e-beam lithography and Ar ion milling through an amorphous carbon (a-C) mask. Junctions with width ranging from 0.2 to 8 μm and oriented along different crystal directions of YBa2Cu3Ox have been produced. Current–voltage characteristics show a behavior consistent with the resistively shunted junction model with small excess current. Junction critical current densities of about 10 kA/cm2 and characteristic voltages up to 6 mV were measured at 4.2 K for the submicron junctions. Junctions along different crystal orientations showed different characteristics suggesting an influence from the d-wave order parameter. |
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ISSN: | 0003-6951 1077-3118 |
DOI: | 10.1063/1.1448176 |