Controlled modifications of electron injection on Au/Si and Au/SiO2/Si contacts using ballistic electron emission microscopy

In this article, ballistic electron emission microscopy (BEEM) induced modifications on Au/Si and Au/SiO2/Si contacts are presented. BEEM current can be locally enhanced or reduced in a controlled manner. These observations are attributed to tip induced modifications on the gold surface. According to Au thickness, x-ray reflectivity experiments show different surface evolutions correlated to the size variations of the modifications introduced as a function of time.