Differential interference contrast x-ray microscopy with submicron resolution

Progress in lithography and nanofabrication [E. Di Fabrizio et al., Nature (London) 401, 895 (1999)] has made it possible to apply differential interference contrast (DIC) in x-ray microscopy using an original x-ray doublet lens based on two specially developed zone plates. Switching from bright-fie...

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Veröffentlicht in:	Applied physics letters 2001-04, Vol.78 (14), p.2082-2084
Hauptverfasser:	Wilhein, Thomas, Kaulich, Burkhard, Di Fabrizio, Enzo, Romanato, Fillipo, Cabrini, Stefano, Susini, Jean
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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