Differential interference contrast x-ray microscopy with submicron resolution
Progress in lithography and nanofabrication [E. Di Fabrizio et al., Nature (London) 401, 895 (1999)] has made it possible to apply differential interference contrast (DIC) in x-ray microscopy using an original x-ray doublet lens based on two specially developed zone plates. Switching from bright-fie...
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Veröffentlicht in: | Applied physics letters 2001-04, Vol.78 (14), p.2082-2084 |
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creator | Wilhein, Thomas Kaulich, Burkhard Di Fabrizio, Enzo Romanato, Fillipo Cabrini, Stefano Susini, Jean |
description | Progress in lithography and nanofabrication [E. Di Fabrizio et al., Nature (London) 401, 895 (1999)] has made it possible to apply differential interference contrast (DIC) in x-ray microscopy using an original x-ray doublet lens based on two specially developed zone plates. Switching from bright-field imaging (absorption contrast) to x-ray DIC, we observe, similar to visible-light microscopy, a dramatic increase in image contrast for weak absorbing samples. We anticipate that this technique will have a significant impact on x-ray imaging and may play a role comparable to DIC imaging in visible-light microscopy. |
doi_str_mv | 10.1063/1.1360776 |
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Di Fabrizio et al., Nature (London) 401, 895 (1999)] has made it possible to apply differential interference contrast (DIC) in x-ray microscopy using an original x-ray doublet lens based on two specially developed zone plates. Switching from bright-field imaging (absorption contrast) to x-ray DIC, we observe, similar to visible-light microscopy, a dramatic increase in image contrast for weak absorbing samples. 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title | Differential interference contrast x-ray microscopy with submicron resolution |
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