The spectral linewidth of tunable semiconductor InAsSb/InAsSbP lasers emitting at 3.2–3.6 μm (2800–3100 cm −1 )
A method was used to measure the width of emission lines of a type of semiconductor laser with composition InAsSb/InAsSbP. This type of laser was manufactured specially for absorption high-resolution spectroscopy of gases absorbing in the 2800–3100 cm −1 region. Parameters used for calculation of sp...
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Veröffentlicht in: | Review of scientific instruments 2001-04, Vol.72 (4), p.1988-1992 |
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Hauptverfasser: | , , , , |
Format: | Artikel |
Sprache: | eng |
Online-Zugang: | Volltext |
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Zusammenfassung: | A method was used to measure the width of emission lines of a type of semiconductor laser with composition InAsSb/InAsSbP. This type of laser was manufactured specially for absorption high-resolution spectroscopy of gases absorbing in the 2800–3100
cm
−1
region. Parameters used for calculation of spectral emission linewidths were obtained using selected rotation-vibration lines of the gaseous molecules
N
2
O
,
CH
3
Cl
,
and OCS. The estimated spectral emission linewidths varied in the range 10–30 MHz in dependence of the current passing and the type of laser. |
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ISSN: | 0034-6748 1089-7623 |
DOI: | 10.1063/1.1353194 |