Minimization of noise-induced bit error rate in a high Tc superconducting dc/single flux quantum converter
The thermally induced bit error rate of a rapid single flux quantum logic circuit is theoretically examined using the Fokker–Planck equation. The error rate versus design parameters of a high Tc dc/single flux quantum converter is derived. In comparison with other design methodologies, a vanishingly...
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| Veröffentlicht in: | Applied physics letters 2001-02, Vol.78 (9), p.1279-1281 |
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| Hauptverfasser: | , , |
| Format: | Artikel |
| Sprache: | eng |
| Online-Zugang: | Volltext |
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| Zusammenfassung: | The thermally induced bit error rate of a rapid single flux quantum logic circuit is theoretically examined using the Fokker–Planck equation. The error rate versus design parameters of a high Tc dc/single flux quantum converter is derived. In comparison with other design methodologies, a vanishingly small error rate at optimal parameters can be achieved. |
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| ISSN: | 0003-6951 1077-3118 |
| DOI: | 10.1063/1.1341228 |