Near-field and far-field optical properties of thin metallic films

Reflectivity measurements in an attenuated total internal reflection (ATIR) geometry and the variation of the transmitted intensity associated to the total electric field in a frustrated ATIR configuration using a photon scanning tunneling microscope (PSTM) of multilayered metallic films are present...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Journal of applied physics 2001-01, Vol.89 (2), p.1138-1144
Hauptverfasser: Dumay, B., Richard, N., David, T., Bourillot, E., Scheurer, F., Beaurepaire, E., Dereux, A., Lacroute, Y.
Format: Artikel
Sprache:eng
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:Reflectivity measurements in an attenuated total internal reflection (ATIR) geometry and the variation of the transmitted intensity associated to the total electric field in a frustrated ATIR configuration using a photon scanning tunneling microscope (PSTM) of multilayered metallic films are presented as a function of the angle of incidence. Eigenmodes for total reflection and absorption associated with the optical properties of magnetic and nonmagnetic materials are theoretically and experimentally determined from the reflected and the transmitted spectra. Good agreement between theory and experiment demonstrates that PSTM is a powerful technique to characterize accurately and locally drastic variations of the intensity around optical modes of a multilayer system.
ISSN:0021-8979
1089-7550
DOI:10.1063/1.1330251