Electron-beam induced degradation in CdTe photovoltaics

We used electron beam induced current (EBIC) to measure degradation of CdTe photovoltaic cells. We have observed that: (i) the EBIC signal shows a considerable, continuous degradation depending on the electron-beam current, scan area, energy, and sample treatment; (ii) the characteristic degradation...

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Veröffentlicht in:	Journal of applied physics 2000-08, Vol.88 (4), p.1794-1801
Hauptverfasser:	Harju, R., Karpov, V. G., Grecu, D., Dorer, G.
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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