Staircase band gap Si1−xGex/Si photodetectors
We fabricated Si1−xGex/Si photodetectors by using a staircase band gap Si1−xGex/Si structure. These devices exhibit a high optical response with a peak responsive wavelength at 0.96 μm and a responsivity of 27.8 A/W at −5 V bias. Excellent electrical characteristics evidenced by good diode rectifica...
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Veröffentlicht in: | Applied physics letters 2000-09, Vol.77 (10), p.1548-1550 |
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Hauptverfasser: | , , , , , , , |
Format: | Artikel |
Sprache: | eng |
Online-Zugang: | Volltext |
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Zusammenfassung: | We fabricated Si1−xGex/Si photodetectors by using a staircase band gap Si1−xGex/Si structure. These devices exhibit a high optical response with a peak responsive wavelength at 0.96 μm and a responsivity of 27.8 A/W at −5 V bias. Excellent electrical characteristics evidenced by good diode rectification are also demonstrated. The dark current density is 0.1 pA/μm2 at −2 V bias, and the breakdown voltage is −27 V. The high response is explained as the result of a staircase band gap by theoretical analysis. |
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ISSN: | 0003-6951 1077-3118 |
DOI: | 10.1063/1.1286958 |