Room-temperature blue luminescence of thermally oxidized Si1−x−yGexCy thin films on Si (100) substrates

We measured at room temperature the photoluminescence spectra of the thermally oxidized Si1−x−yGexCy thin films which were grown on silicon substrates by plasma-enhanced chemical vapor deposition and then wet oxidized at 1100 °C for 20 min. The photoluminescence band with a peak at ∼393 nm under the...

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Veröffentlicht in:Applied physics letters 1999-11, Vol.75 (21), p.3333-3335
Hauptverfasser: Cheng, Xuemei, Zheng, Youdou, Liu, Xiabing, Zang, Lan, Lo, Zhiyun, Zhu, Shunming, Han, Ping, Jiang, Ruolian
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Sprache:eng
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Zusammenfassung:We measured at room temperature the photoluminescence spectra of the thermally oxidized Si1−x−yGexCy thin films which were grown on silicon substrates by plasma-enhanced chemical vapor deposition and then wet oxidized at 1100 °C for 20 min. The photoluminescence band with a peak at ∼393 nm under the exciting radiation of λ=241 nm was observed. Possible mechanism of this photoluminescence is discussed.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.125342