Domain imaging and local piezoelectric properties of the (200)-predominant SrBi2Ta2O9 thin film

The domain structure of the (200)-predominant SrBi2Ta2O9 (SBT) thin film was detected by an atomic force microscope in the piezoelectric mode. It was found that the content of the grains split by single domain walls is less than 5%. The types of domain walls formed in individual grains were identifi...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Applied physics letters 1999-09, Vol.75 (11), p.1610-1612
Hauptverfasser: Hu, G. D., Xu, J. B., Wilson, I. H.
Format: Artikel
Sprache:eng
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:The domain structure of the (200)-predominant SrBi2Ta2O9 (SBT) thin film was detected by an atomic force microscope in the piezoelectric mode. It was found that the content of the grains split by single domain walls is less than 5%. The types of domain walls formed in individual grains were identified by analyzing the dependence of piezoelectric coefficient (d33) on the alternating current driving electric field. Several grains larger than 300 nm were found to be split by non-180° domain walls. To study the switching properties, the (200)-predominant SBT thin film was polarized and imaged over a large area. Unswitchable grains cannot be observed both in the area polarized using +8 V and in the region polarized using −8 V.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.124770