Domain imaging and local piezoelectric properties of the (200)-predominant SrBi2Ta2O9 thin film
The domain structure of the (200)-predominant SrBi2Ta2O9 (SBT) thin film was detected by an atomic force microscope in the piezoelectric mode. It was found that the content of the grains split by single domain walls is less than 5%. The types of domain walls formed in individual grains were identifi...
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Veröffentlicht in: | Applied physics letters 1999-09, Vol.75 (11), p.1610-1612 |
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Hauptverfasser: | , , |
Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | The domain structure of the (200)-predominant SrBi2Ta2O9 (SBT) thin film was detected by an atomic force microscope in the piezoelectric mode. It was found that the content of the grains split by single domain walls is less than 5%. The types of domain walls formed in individual grains were identified by analyzing the dependence of piezoelectric coefficient (d33) on the alternating current driving electric field. Several grains larger than 300 nm were found to be split by non-180° domain walls. To study the switching properties, the (200)-predominant SBT thin film was polarized and imaged over a large area. Unswitchable grains cannot be observed both in the area polarized using +8 V and in the region polarized using −8 V. |
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ISSN: | 0003-6951 1077-3118 |
DOI: | 10.1063/1.124770 |