Si δ-layers embedded in GaAs
An ultrathin, 1–6 monolayers (MLs) thick, Si δ layer, is embedded in bulk GaAs. The normally observed self-assembling with resulting phase separation can be avoided until δ-layer thickness of 4 MLs, which opens the possibility to study two-dimensional (2D) properties of this III–V/IV heterostructure...
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Veröffentlicht in: | Applied physics letters 1998-12, Vol.73 (25), p.3709-3711 |
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Hauptverfasser: | , , , , , , , , , |
Format: | Artikel |
Sprache: | eng |
Online-Zugang: | Volltext |
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Zusammenfassung: | An ultrathin, 1–6 monolayers (MLs) thick, Si δ layer, is embedded in bulk GaAs. The normally observed self-assembling with resulting phase separation can be avoided until δ-layer thickness of 4 MLs, which opens the possibility to study two-dimensional (2D) properties of this III–V/IV heterostructure. Optical, electrical, transport, and structural characterization of the Si δ layer has been carried out. In luminescence, two novel emission bands are observed, which are blueshifted as the width of the Si δ layer is reduced, indicating pronounced 2D properties. The derived results on transition energies and electronic structure are compared with theoretical predictions obtained by a self-consistent approach. |
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ISSN: | 0003-6951 1077-3118 |
DOI: | 10.1063/1.122871 |