Compensation ratio-dependent concentration of a VInH4 complex in n -type liquid encapsulated Czochralski InP

The concentration of hydrogen–indium vacancy complex VInH4 in liquid encapsulated Czochralski undoped and Fe-doped n-type InP has been studied by low-temperature infrared absorption spectroscopy. The VInH4 complex is found to be a dominant intrinsic shallow donor defect with concentrations up to ∼10...

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Veröffentlicht in:Applied physics letters 1998-08, Vol.73 (9), p.1275-1277
Hauptverfasser: Fung, S., Zhao, Y. W., Beling, C. D., Xu, X. L., Gong, M., Sun, N. F., Sun, T. N., Chen, X. D., Zhang, R. G., Liu, S. L., Yang, G. Y., Qian, J. J., Sun, M. F., Liu, X. L.
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Sprache:eng
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Zusammenfassung:The concentration of hydrogen–indium vacancy complex VInH4 in liquid encapsulated Czochralski undoped and Fe-doped n-type InP has been studied by low-temperature infrared absorption spectroscopy. The VInH4 complex is found to be a dominant intrinsic shallow donor defect with concentrations up to ∼1016 cm−3 in as-grown liquid encapsulated Czochralski InP. The concentration of the VInH4 complex is found to increase with the compensation ratio in good agreement with the proposed defect formation model of Walukiewicz [W. Walukiewicz, Phys. Rev. B 37, 4760 (1998); Appl. Phys. Lett. 54, 2094 (1989)], which predicts a Fermi-level-dependent concentration of amphoteric defects.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.122270