Quantitative nonlinear dielectric microscopy of periodically polarized ferroelectric domains

Quantitative nonlinear dielectric microscopy of periodically polarized ferroelectric domains

A nonlinear dielectric scanning tip microwave near-field microscope capable of submicron quantitative imaging of nonlinear dielectric constant was developed. This nondestructive technique was used to image the nonlinear dielectric constant profiles of an yttrium-doped LiNbO3 single crystal with peri...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Applied Physics Letters 1998-08, Vol.73 (8), p.1146-1148
Hauptverfasser: Gao, Chen, Duewer, Fred, Lu, Yalin, Xiang, X.-D.
Format: Artikel
Sprache:eng
Schlagworte:
DIELECTRIC PROPERTIES
DOMAIN STRUCTURE
DOPED MATERIALS
FERROELECTRIC MATERIALS
LITHIUM COMPOUNDS
LITHIUM OXIDES
MATERIALS SCIENCE
MICROSCOPY
MICROWAVE RADIATION
NIOBATES
NONDESTRUCTIVE TESTING
POLARIZATION
YTTRIUM
YTTRIUM ADDITIONS
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:A nonlinear dielectric scanning tip microwave near-field microscope capable of submicron quantitative imaging of nonlinear dielectric constant was developed. This nondestructive technique was used to image the nonlinear dielectric constant profiles of an yttrium-doped LiNbO3 single crystal with periodically polarized ferroelectric domains.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.122111