High definition aperture probes for near-field optical microscopy fabricated by focused ion beam milling

We have improved the optical characteristics of aluminum-coated fiber probes used in near-field scanning optical microscopy by milling with a focused ion beam. This treatment produces a flat-end face free of aluminum grains, containing a well-defined circularly-symmetric aperture with controllable d...

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Veröffentlicht in:	Applied physics letters 1998-06, Vol.72 (24), p.3115-3117
Hauptverfasser:	Veerman, J. A., Otter, A. M., Kuipers, L., van Hulst, N. F.
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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