High definition aperture probes for near-field optical microscopy fabricated by focused ion beam milling

We have improved the optical characteristics of aluminum-coated fiber probes used in near-field scanning optical microscopy by milling with a focused ion beam. This treatment produces a flat-end face free of aluminum grains, containing a well-defined circularly-symmetric aperture with controllable d...

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Veröffentlicht in:Applied physics letters 1998-06, Vol.72 (24), p.3115-3117
Hauptverfasser: Veerman, J. A., Otter, A. M., Kuipers, L., van Hulst, N. F.
Format: Artikel
Sprache:eng
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Zusammenfassung:We have improved the optical characteristics of aluminum-coated fiber probes used in near-field scanning optical microscopy by milling with a focused ion beam. This treatment produces a flat-end face free of aluminum grains, containing a well-defined circularly-symmetric aperture with controllable diameter down to 20 nm. The polarization behavior of the tips is circularly symmetric with a polarization ratio exceeding 1:100. The improved imaging characteristics are demonstrated by measuring single molecule fluorescence. Count rates increase more than one order of magnitude over unmodified probes, and the molecule images map a spatial electric field distribution of the aperture in agreement with calculations.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.121564