Temperature dependence of a high-Tc single-flux-quantum logic gate up to 50 K

Basic characteristics of a simple single-flux-quantum (SFQ) logic gate using high-Tc material and Josephson junction (NdBa2Cu3O7−δ and focused ion beam junction) have been investigated. The logic gate consists of an rf-superconducting quantum interference device (rf-SQUID) and a dc-SQUID. In the logic gate, elementary SFQ logic operations, such as generating SFQ (dc/SFQ) and providing simultaneous readout (SFQ/dc), have been confirmed up to 50 K. The temperature dependencies of the output voltage level and the critical current-normal resistance (IcRn) product were compared, and the decreasing tendency of the output voltage level for increasing temperature was found to be more rapid than that of the IcRn product.