Band lineup between CdS and ultra high vacuum-cleaved CuInS2 single crystals

The interface formation between vacuum evaporated CdS and ultrahigh vacuum-cleaved CuInS2 single crystals has been studied by synchrotron excited photoelectron spectroscopy. The valence band discontinuity is determined directly from valence band difference spectra to be ΔEV=0.6 (±0.1) eV. This value...

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Veröffentlicht in:Applied physics letters 1997-03, Vol.70 (10), p.1299-1301
Hauptverfasser: Klein, A., Löher, T., Tomm, Y., Pettenkofer, C., Jaegermann, W.
Format: Artikel
Sprache:eng
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Zusammenfassung:The interface formation between vacuum evaporated CdS and ultrahigh vacuum-cleaved CuInS2 single crystals has been studied by synchrotron excited photoelectron spectroscopy. The valence band discontinuity is determined directly from valence band difference spectra to be ΔEV=0.6 (±0.1) eV. This value is significantly smaller than for other preparation conditions given in the literature and evidently not suitable for solar cell applications. The similarity to observations at the CdS/CuInS2 interfaces suggests that neutrality levels play a dominant role in establishing the band lineup at interfaces containing chalcopyrite semiconductors.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.118517