Phase-matched second-harmonic generation at 789.5 nm in a GaSe crystal

Phase-matched second-harmonic generation in the highly χ(2)-active layered semiconductor GaSe is demonstrated in the near-infrared frequency region. Due to the high indices of refraction, the internal phase-matching angle of about 30° is beyond the critical angle of total reflection for a z-cut crys...

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Veröffentlicht in:Applied physics letters 1996-08, Vol.69 (6), p.731-733
Hauptverfasser: Kador, L., Haarer, D., Allakhverdiev, K. R., Salaev, E. Yu
Format: Artikel
Sprache:eng
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Zusammenfassung:Phase-matched second-harmonic generation in the highly χ(2)-active layered semiconductor GaSe is demonstrated in the near-infrared frequency region. Due to the high indices of refraction, the internal phase-matching angle of about 30° is beyond the critical angle of total reflection for a z-cut crystal. This problem is overcome by sandwiching the crystal between two half-cylindrical glass rods, which leads to a shift of the critical angle to larger values.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.117873