Back-gating effect of low-temperature GaAs on a pseudomorphic modulation-doped field-effect transistor
Low-temperature (LT) photoluminescence (PL) measurements on pseudomorphic modulation-doped transistors with a (LT) GaAs layer in the GaAs substrate have revealed the existence of a substrate voltage. The substrate voltage is manifested by a decrease in the PL transition energies of the quantum-well...
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Veröffentlicht in: | Applied physics letters 1996-10, Vol.69 (15), p.2234-2236 |
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Hauptverfasser: | , , , , , , , , |
Format: | Artikel |
Sprache: | eng |
Online-Zugang: | Volltext |
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Zusammenfassung: | Low-temperature (LT) photoluminescence (PL) measurements on pseudomorphic modulation-doped transistors with a (LT) GaAs layer in the GaAs substrate have revealed the existence of a substrate voltage. The substrate voltage is manifested by a decrease in the PL transition energies of the quantum-well subbands due to the quantum confined Stark effect. Our results indicate that the substrate voltage is generated by the trapping of holes from the undoped molecular-beam-epitaxy-grown GaAs at the GaAs/LT GaAs interface by the high concentration of arsenic antisite defects in the LT GaAs layer. |
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ISSN: | 0003-6951 1077-3118 |
DOI: | 10.1063/1.117138 |