Back-gating effect of low-temperature GaAs on a pseudomorphic modulation-doped field-effect transistor

Low-temperature (LT) photoluminescence (PL) measurements on pseudomorphic modulation-doped transistors with a (LT) GaAs layer in the GaAs substrate have revealed the existence of a substrate voltage. The substrate voltage is manifested by a decrease in the PL transition energies of the quantum-well...

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Veröffentlicht in:Applied physics letters 1996-10, Vol.69 (15), p.2234-2236
Hauptverfasser: Folkes, P. A., Smith, Doran, Lux, R. A., Zhou, W., Thompson, R., Moerkirk, R., Lemeune, M., Cooke, P., Brown, K.
Format: Artikel
Sprache:eng
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Zusammenfassung:Low-temperature (LT) photoluminescence (PL) measurements on pseudomorphic modulation-doped transistors with a (LT) GaAs layer in the GaAs substrate have revealed the existence of a substrate voltage. The substrate voltage is manifested by a decrease in the PL transition energies of the quantum-well subbands due to the quantum confined Stark effect. Our results indicate that the substrate voltage is generated by the trapping of holes from the undoped molecular-beam-epitaxy-grown GaAs at the GaAs/LT GaAs interface by the high concentration of arsenic antisite defects in the LT GaAs layer.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.117138