Characterization of diffusion length degradation in Czochralski silicon solar cells

Characterization of diffusion length degradation in Czochralski silicon solar cells

Commercially produced, unencapsulated, Czochralski (CZ) silicon solar cells can lose 3%–4% (relative) of their initial efficiency after exposure to light, after minority-carrier injection during dark forward bias, or after thermal treatment at 100–400 °C. All three degradation methods reduce the min...

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Veröffentlicht in:Applied physics letters 1996-06, Vol.68 (23), p.3302-3304
Hauptverfasser: Reiss, J. H., King, R. R., Mitchell, K. W.
Format: Artikel
Sprache:eng
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Zusammenfassung:Commercially produced, unencapsulated, Czochralski (CZ) silicon solar cells can lose 3%–4% (relative) of their initial efficiency after exposure to light, after minority-carrier injection during dark forward bias, or after thermal treatment at 100–400 °C. All three degradation methods reduce the minority-carrier diffusion length in the cell substrate. Under light, the decrease in efficiency is rapid (
ISSN:0003-6951
1077-3118
DOI:10.1063/1.116581