Optical characterization of waveguide based photonic microstructures

Third-order, one-dimensional, semiconductor-air gratings have been designed, fabricated, and evaluated by optical waveguide transmission measurements. Gratings with as little as six unit cells show a clear band edge around 840–850 nm. Owing to our approach of semiconductor-rich lattices with small a...

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Veröffentlicht in:Applied physics letters 1996-03, Vol.68 (12), p.1613-1615
Hauptverfasser: Krauss, Thomas F., De La Rue, Richard M.
Format: Artikel
Sprache:eng
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Zusammenfassung:Third-order, one-dimensional, semiconductor-air gratings have been designed, fabricated, and evaluated by optical waveguide transmission measurements. Gratings with as little as six unit cells show a clear band edge around 840–850 nm. Owing to our approach of semiconductor-rich lattices with small airgaps, the diffractive spreading loss is sufficiently small (∼50% in the passband) for meaningful results to be extracted. The measurements indicate that the optical waveguide approach is a good starting point for the study of photonic microstructures and that practical device concepts can be implemented.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.115668