Controlled-atmosphere chamber for atomic force microscopy investigations

The present work describes a simple chamber suitable for morphological investigations by implementing the atomic force microscopy (AFM) in controlled experiments. The novelty of our application stems from proposing an open system located in between the expensive, ultra-high-vacuum instruments and th...

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Veröffentlicht in:	Review of scientific instruments 2000-06, Vol.71 (6), p.2409-2413
Hauptverfasser:	Sartore, Marco, Pace, Raffaele, Faraci, Paolo, Nardelli, Daniele, Adami, Manuela, Ram, Manoj K., Nicolini, Claudio
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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