Low temperature ultrahigh vacuum cross-sectional scanning tunneling microscope for luminescence measurements

Low temperature ultrahigh vacuum cross-sectional scanning tunneling microscope for luminescence measurements

We have constructed a scanning tunneling microscope with simultaneous light collection capabilities in order to investigate the opto-electronic properties of semiconductors. The microscope has in situ sample cleavage mechanism for cross-sectional sample. In order to reach low temperature (4 K), we u...

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Veröffentlicht in:Review of scientific instruments 1999-12, Vol.70 (12), p.4595-4599
Hauptverfasser: Khang, Yoonho, Park, Yeonjoon, Salmeron, Miquel, Weber, Eicke R.
Format: Artikel
Sprache:eng
Schlagworte:
CATHODOLUMINESCENCE
CROSS SECTIONS
CRYOSTATS
EFFICIENCY
EXPERIMENTAL DATA
INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
LUMINESCENCE
MIRRORS
SCANNING ELECTRON MICROSCOPY
SEMICONDUCTOR MATERIALS
TUNNEL EFFECT
VACUUM SYSTEMS
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Zusammenfassung:We have constructed a scanning tunneling microscope with simultaneous light collection capabilities in order to investigate the opto-electronic properties of semiconductors. The microscope has in situ sample cleavage mechanism for cross-sectional sample. In order to reach low temperature (4 K), we used a specially designed cryostat. The efficiency of light collection generated in the tip-surface junction was greatly improved by use of a small parabolic mirror with the tip located at its focal point.
ISSN:0034-6748
1089-7623
DOI:10.1063/1.1150118