MEPHISTO: Performance tests of a novel synchrotron imaging photoelectron spectromicroscope
We discuss the scheme and test performances of this recently commissioned system in its final configuration. The tests show that the improvements in the electron optics system with respect to other instruments in the same class made it possible to reach lateral resolutions in the 50 nm range. They a...
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Veröffentlicht in: | Review of scientific instruments 1998-05, Vol.69 (5), p.2062-2066 |
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container_issue | 5 |
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container_title | Review of scientific instruments |
container_volume | 69 |
creator | De Stasio, Gelsomina Capozi, M. Lorusso, G. F. Baudat, P. A. Droubay, T. C. Perfetti, P. Margaritondo, G. Tonner, B. P. |
description | We discuss the scheme and test performances of this recently commissioned system in its final configuration. The tests show that the improvements in the electron optics system with respect to other instruments in the same class made it possible to reach lateral resolutions in the 50 nm range. They also demonstrate rather good spectromicroscopy and spectroscopy performances, reliability and flexibility of operation. |
doi_str_mv | 10.1063/1.1148899 |
format | Article |
fullrecord | <record><control><sourceid>scitation_cross</sourceid><recordid>TN_cdi_crossref_primary_10_1063_1_1148899</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>rsi</sourcerecordid><originalsourceid>FETCH-LOGICAL-c398t-1bb1f5649b0ac4090f3c9b7daad884f2439368a8d6e81851e6dc12c1bfdf132b3</originalsourceid><addsrcrecordid>eNqdkE9LAzEQxYMouFYPfoNcFbZmNmk28SaltYVKC9aLlyWbTdqV3c2ShEK_vf0H3p3LDI8f8x4PoUcgQyCcvsAQgAkh5RVKgAiZ5jyj1yghhLKU50zcorsQfshhRgAJ-v6YrGbzz_XyFa-Mt863qtMGRxNiwM5ihTu3Mw0O-05vvYvedbhu1abuNrjfuuhMY_RJDf3paGvtXdCuN_foxqommIfLHqCv6WQ9nqWL5ft8_LZINZUiplCWYEecyZIozYgklmpZ5pVSlRDMZoxKyoUSFTcCxAgMrzRkGkpbWaBZSQfo6fz3aBy8sUXvDxH9vgBSHEspoLiUcmCfz2zQdVSxdt3_4J3zf2DRV5b-AtzhcfM</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>MEPHISTO: Performance tests of a novel synchrotron imaging photoelectron spectromicroscope</title><source>AIP Digital Archive</source><creator>De Stasio, Gelsomina ; Capozi, M. ; Lorusso, G. F. ; Baudat, P. A. ; Droubay, T. C. ; Perfetti, P. ; Margaritondo, G. ; Tonner, B. P.</creator><creatorcontrib>De Stasio, Gelsomina ; Capozi, M. ; Lorusso, G. F. ; Baudat, P. A. ; Droubay, T. C. ; Perfetti, P. ; Margaritondo, G. ; Tonner, B. P.</creatorcontrib><description>We discuss the scheme and test performances of this recently commissioned system in its final configuration. The tests show that the improvements in the electron optics system with respect to other instruments in the same class made it possible to reach lateral resolutions in the 50 nm range. They also demonstrate rather good spectromicroscopy and spectroscopy performances, reliability and flexibility of operation.</description><identifier>ISSN: 0034-6748</identifier><identifier>EISSN: 1089-7623</identifier><identifier>DOI: 10.1063/1.1148899</identifier><identifier>CODEN: RSINAK</identifier><language>eng</language><ispartof>Review of scientific instruments, 1998-05, Vol.69 (5), p.2062-2066</ispartof><rights>American Institute of Physics</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c398t-1bb1f5649b0ac4090f3c9b7daad884f2439368a8d6e81851e6dc12c1bfdf132b3</citedby><cites>FETCH-LOGICAL-c398t-1bb1f5649b0ac4090f3c9b7daad884f2439368a8d6e81851e6dc12c1bfdf132b3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://pubs.aip.org/rsi/article-lookup/doi/10.1063/1.1148899$$EHTML$$P50$$Gscitation$$H</linktohtml><link.rule.ids>314,776,780,1553,27901,27902,76132</link.rule.ids></links><search><creatorcontrib>De Stasio, Gelsomina</creatorcontrib><creatorcontrib>Capozi, M.</creatorcontrib><creatorcontrib>Lorusso, G. F.</creatorcontrib><creatorcontrib>Baudat, P. A.</creatorcontrib><creatorcontrib>Droubay, T. C.</creatorcontrib><creatorcontrib>Perfetti, P.</creatorcontrib><creatorcontrib>Margaritondo, G.</creatorcontrib><creatorcontrib>Tonner, B. P.</creatorcontrib><title>MEPHISTO: Performance tests of a novel synchrotron imaging photoelectron spectromicroscope</title><title>Review of scientific instruments</title><description>We discuss the scheme and test performances of this recently commissioned system in its final configuration. The tests show that the improvements in the electron optics system with respect to other instruments in the same class made it possible to reach lateral resolutions in the 50 nm range. They also demonstrate rather good spectromicroscopy and spectroscopy performances, reliability and flexibility of operation.</description><issn>0034-6748</issn><issn>1089-7623</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1998</creationdate><recordtype>article</recordtype><recordid>eNqdkE9LAzEQxYMouFYPfoNcFbZmNmk28SaltYVKC9aLlyWbTdqV3c2ShEK_vf0H3p3LDI8f8x4PoUcgQyCcvsAQgAkh5RVKgAiZ5jyj1yghhLKU50zcorsQfshhRgAJ-v6YrGbzz_XyFa-Mt863qtMGRxNiwM5ihTu3Mw0O-05vvYvedbhu1abuNrjfuuhMY_RJDf3paGvtXdCuN_foxqommIfLHqCv6WQ9nqWL5ft8_LZINZUiplCWYEecyZIozYgklmpZ5pVSlRDMZoxKyoUSFTcCxAgMrzRkGkpbWaBZSQfo6fz3aBy8sUXvDxH9vgBSHEspoLiUcmCfz2zQdVSxdt3_4J3zf2DRV5b-AtzhcfM</recordid><startdate>19980501</startdate><enddate>19980501</enddate><creator>De Stasio, Gelsomina</creator><creator>Capozi, M.</creator><creator>Lorusso, G. F.</creator><creator>Baudat, P. A.</creator><creator>Droubay, T. C.</creator><creator>Perfetti, P.</creator><creator>Margaritondo, G.</creator><creator>Tonner, B. P.</creator><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>19980501</creationdate><title>MEPHISTO: Performance tests of a novel synchrotron imaging photoelectron spectromicroscope</title><author>De Stasio, Gelsomina ; Capozi, M. ; Lorusso, G. F. ; Baudat, P. A. ; Droubay, T. C. ; Perfetti, P. ; Margaritondo, G. ; Tonner, B. P.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c398t-1bb1f5649b0ac4090f3c9b7daad884f2439368a8d6e81851e6dc12c1bfdf132b3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1998</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>De Stasio, Gelsomina</creatorcontrib><creatorcontrib>Capozi, M.</creatorcontrib><creatorcontrib>Lorusso, G. F.</creatorcontrib><creatorcontrib>Baudat, P. A.</creatorcontrib><creatorcontrib>Droubay, T. C.</creatorcontrib><creatorcontrib>Perfetti, P.</creatorcontrib><creatorcontrib>Margaritondo, G.</creatorcontrib><creatorcontrib>Tonner, B. P.</creatorcontrib><collection>CrossRef</collection><jtitle>Review of scientific instruments</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>De Stasio, Gelsomina</au><au>Capozi, M.</au><au>Lorusso, G. F.</au><au>Baudat, P. A.</au><au>Droubay, T. C.</au><au>Perfetti, P.</au><au>Margaritondo, G.</au><au>Tonner, B. P.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>MEPHISTO: Performance tests of a novel synchrotron imaging photoelectron spectromicroscope</atitle><jtitle>Review of scientific instruments</jtitle><date>1998-05-01</date><risdate>1998</risdate><volume>69</volume><issue>5</issue><spage>2062</spage><epage>2066</epage><pages>2062-2066</pages><issn>0034-6748</issn><eissn>1089-7623</eissn><coden>RSINAK</coden><abstract>We discuss the scheme and test performances of this recently commissioned system in its final configuration. The tests show that the improvements in the electron optics system with respect to other instruments in the same class made it possible to reach lateral resolutions in the 50 nm range. They also demonstrate rather good spectromicroscopy and spectroscopy performances, reliability and flexibility of operation.</abstract><doi>10.1063/1.1148899</doi><tpages>5</tpages><oa>free_for_read</oa></addata></record> |
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title | MEPHISTO: Performance tests of a novel synchrotron imaging photoelectron spectromicroscope |
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