X‐ray fluorescence analysis with high energy resolution

The analysis of x‐ray fluorescence lines with total energy resolution of 1 eV or better can provide detailed information on the electronic structure of the sample in addition to quantitative elemental analysis of the sample. A perfect crystal spectrometer was developed for this purpose. Preliminary...

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Veröffentlicht in:	Review of Scientific Instruments 1996-09, Vol.67 (9), p.3359-3359
Hauptverfasser:	Caliebe, Wolfgang A., Bajt, Sas̆a, Kao, Chi‐Chang
Format:	Artikel
Sprache:	eng
Schlagworte:	BNL CHROMIUM OXIDES INSTRUMENTATION, INCLUDING NUCLEAR AND PARTICLE DETECTORS NSLS PARTICLE ACCELERATORS QUANTITATIVE CHEMICAL ANALYSIS RESOLUTION SYNCHROTRON RADIATION USES X-RAY FLUORESCENCE ANALYSIS
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Beschreibung
Zusammenfassung:	The analysis of x‐ray fluorescence lines with total energy resolution of 1 eV or better can provide detailed information on the electronic structure of the sample in addition to quantitative elemental analysis of the sample. A perfect crystal spectrometer was developed for this purpose. Preliminary results from a series of chromium oxides will be presented.
ISSN:	0034-6748 1089-7623
DOI:	10.1063/1.1147385