A cryostatic setup for the low‐temperature measurement of thermal diffusivity with the photothermal method

A cryostatic setup for the low‐temperature measurement of thermal diffusivity with the photothermal method

A cryostatic setup is described to perform photothermal deflection measurements from room temperature to 77 K. The setup uses gaseous nitrogen as a medium where the photodeflection is produced. The ability of the system to work is demonstrated presenting some measurements of thermal diffusivity of h...

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Veröffentlicht in:Review of Scientific Instruments 1995-12, Vol.66 (12), p.5598-5602
Hauptverfasser: Bertolotti, M., Liakhou, G., Li Voti, R., Paoloni, S., Sibilia, C., Sparvieri, N.
Format: Artikel
Sprache:eng
Schlagworte:
CRYOSTATS
FERRITE GARNETS
HIGH-TC SUPERCONDUCTORS
MEASURING INSTRUMENTS
PHYSICS
TEMPERATURE RANGE 0065-0273 K
TEMPERATURE RANGE 0273-0400 K
THERMAL DIFFUSIVITY
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Zusammenfassung:A cryostatic setup is described to perform photothermal deflection measurements from room temperature to 77 K. The setup uses gaseous nitrogen as a medium where the photodeflection is produced. The ability of the system to work is demonstrated presenting some measurements of thermal diffusivity of high‐temperature superconductor samples and of yttrium‐iron garnets with variable aluminum content.
ISSN:0034-6748
1089-7623
DOI:10.1063/1.1146026