Quantitative x‐ray emission from a DPF device
The x‐ray emission was measured from a Dense Plasma Focus (DPF) device. The high density plasma is generated by an electrical discharge in rarefied‐neon gas between electrodes in a Mather‐type plasma focus configuration. A curved‐crystal x‐ray spectrograph, a pinhole camera, and an active‐filtered p...
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Veröffentlicht in: | Review of Scientific Instruments 1992-10, Vol.63 (10), p.5052-5055 |
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Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | The x‐ray emission was measured from a Dense Plasma Focus (DPF) device. The high density plasma is generated by an electrical discharge in rarefied‐neon gas between electrodes in a Mather‐type plasma focus configuration. A curved‐crystal x‐ray spectrograph, a pinhole camera, and an active‐filtered photodiode were the diagnostics viewing the axial output of the pinched‐plasma region. The x‐ray pinhole images indicate a pinched volume roughly 8 mm in length with a nearly circular cross section of about 300 μm in diameter. The digitized spectral traces were computer processed to obtain absolute x‐ray line intensities. The neon plasma yielded 10–15 J of K‐shell radiation into 4π with the hydrogenlike and heliumlike alpha lines totaling 55%–65% of the total spectral emission. The x‐ray emission of the DPF device was studied as a function of discharge current and anode diameter. |
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ISSN: | 0034-6748 1089-7623 |
DOI: | 10.1063/1.1143489 |