Low‐stress, coolable sample mount for ultrahigh vacuum studies of fragile semiconductors
A sample mount is described that is particularly useful for cooling and uniformly heating thin, fragile semiconductor samples in ultrahigh vacuum while maintaining optical flatness. The design is based on spring‐loaded clips and permits rapid sample exchange. Difficulties with certain conventional m...
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| Veröffentlicht in: | Review of scientific instruments 1992-01, Vol.63 (1), p.218-219 |
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| container_end_page | 219 |
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| container_issue | 1 |
| container_start_page | 218 |
| container_title | Review of scientific instruments |
| container_volume | 63 |
| creator | Schultz, K. A. Seebauer, E. G. |
| description | A sample mount is described that is particularly useful for cooling and uniformly heating thin, fragile semiconductor samples in ultrahigh vacuum while maintaining optical flatness. The design is based on spring‐loaded clips and permits rapid sample exchange. Difficulties with certain conventional methods of temperature measurement are avoided. |
| doi_str_mv | 10.1063/1.1142960 |
| format | Article |
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G.</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>OSTI.GOV</collection><jtitle>Review of scientific instruments</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Schultz, K. A.</au><au>Seebauer, E. G.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Low‐stress, coolable sample mount for ultrahigh vacuum studies of fragile semiconductors</atitle><jtitle>Review of scientific instruments</jtitle><date>1992-01</date><risdate>1992</risdate><volume>63</volume><issue>1</issue><spage>218</spage><epage>219</epage><pages>218-219</pages><issn>0034-6748</issn><eissn>1089-7623</eissn><coden>RSINAK</coden><abstract>A sample mount is described that is particularly useful for cooling and uniformly heating thin, fragile semiconductor samples in ultrahigh vacuum while maintaining optical flatness. 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| fulltext | fulltext |
| identifier | ISSN: 0034-6748 |
| ispartof | Review of scientific instruments, 1992-01, Vol.63 (1), p.218-219 |
| issn | 0034-6748 1089-7623 |
| language | eng |
| recordid | cdi_crossref_primary_10_1063_1_1142960 |
| source | AIP Digital Archive |
| subjects | 440800 - Miscellaneous Instrumentation- (1990-) DESIGN Exact sciences and technology Instruments, apparatus, components and techniques common to several branches of physics and astronomy OTHER INSTRUMENTATION Physics SAMPLE HOLDERS ULTRAHIGH VACUUM Vacuum apparatus and techniques |
| title | Low‐stress, coolable sample mount for ultrahigh vacuum studies of fragile semiconductors |
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