Low‐stress, coolable sample mount for ultrahigh vacuum studies of fragile semiconductors
A sample mount is described that is particularly useful for cooling and uniformly heating thin, fragile semiconductor samples in ultrahigh vacuum while maintaining optical flatness. The design is based on spring‐loaded clips and permits rapid sample exchange. Difficulties with certain conventional m...
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Veröffentlicht in: | Review of scientific instruments 1992-01, Vol.63 (1), p.218-219 |
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Hauptverfasser: | , |
Format: | Artikel |
Sprache: | eng |
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Online-Zugang: | Volltext |
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Zusammenfassung: | A sample mount is described that is particularly useful for cooling and uniformly heating thin, fragile semiconductor samples in ultrahigh vacuum while maintaining optical flatness. The design is based on spring‐loaded clips and permits rapid sample exchange. Difficulties with certain conventional methods of temperature measurement are avoided. |
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ISSN: | 0034-6748 1089-7623 |
DOI: | 10.1063/1.1142960 |