Conducting atomic force microscopy of alkane layers on graphite

We have used an atomic force microscope with a conducting tip to investigate the layering of hexadecane on graphite. Discrete jumps were observed in both the tip–sample conductance and separation as individual liquid layers are penetrated. These conductance measurements extend solvation studies to h...

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Veröffentlicht in:	Applied Physics Letters 1995-05, Vol.66 (19), p.2478-2480
Hauptverfasser:	Klein, David L., McEuen, Paul L.
Format:	Artikel
Sprache:	eng
Schlagworte:	GRAPHITE HEXADECANE INSTRUMENTATION, INCLUDING NUCLEAR AND PARTICLE DETECTORS MATERIALS SCIENCE MICROSCOPY SURFACE PROPERTIES THIN FILMS TUNNELING VIBRATIONAL STATES
Online-Zugang:	Volltext
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