Conducting atomic force microscopy of alkane layers on graphite

We have used an atomic force microscope with a conducting tip to investigate the layering of hexadecane on graphite. Discrete jumps were observed in both the tip–sample conductance and separation as individual liquid layers are penetrated. These conductance measurements extend solvation studies to higher force scales than have been previously achieved, and can be used to determine when the tip makes contact with the substrate. The layering also enables the formation of stable tunneling junctions.