Conducting atomic force microscopy of alkane layers on graphite
We have used an atomic force microscope with a conducting tip to investigate the layering of hexadecane on graphite. Discrete jumps were observed in both the tip–sample conductance and separation as individual liquid layers are penetrated. These conductance measurements extend solvation studies to h...
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| Veröffentlicht in: | Applied Physics Letters 1995-05, Vol.66 (19), p.2478-2480 |
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| container_end_page | 2480 |
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| container_issue | 19 |
| container_start_page | 2478 |
| container_title | Applied Physics Letters |
| container_volume | 66 |
| creator | Klein, David L. McEuen, Paul L. |
| description | We have used an atomic force microscope with a conducting tip to investigate the layering of hexadecane on graphite. Discrete jumps were observed in both the tip–sample conductance and separation as individual liquid layers are penetrated. These conductance measurements extend solvation studies to higher force scales than have been previously achieved, and can be used to determine when the tip makes contact with the substrate. The layering also enables the formation of stable tunneling junctions. |
| doi_str_mv | 10.1063/1.114001 |
| format | Article |
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Discrete jumps were observed in both the tip–sample conductance and separation as individual liquid layers are penetrated. These conductance measurements extend solvation studies to higher force scales than have been previously achieved, and can be used to determine when the tip makes contact with the substrate. 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Discrete jumps were observed in both the tip–sample conductance and separation as individual liquid layers are penetrated. These conductance measurements extend solvation studies to higher force scales than have been previously achieved, and can be used to determine when the tip makes contact with the substrate. The layering also enables the formation of stable tunneling junctions.</abstract><cop>United States</cop><doi>10.1063/1.114001</doi><tpages>3</tpages></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 0003-6951 |
| ispartof | Applied Physics Letters, 1995-05, Vol.66 (19), p.2478-2480 |
| issn | 0003-6951 1077-3118 |
| language | eng |
| recordid | cdi_crossref_primary_10_1063_1_114001 |
| source | AIP Digital Archive |
| subjects | GRAPHITE HEXADECANE INSTRUMENTATION, INCLUDING NUCLEAR AND PARTICLE DETECTORS MATERIALS SCIENCE MICROSCOPY SURFACE PROPERTIES THIN FILMS TUNNELING VIBRATIONAL STATES |
| title | Conducting atomic force microscopy of alkane layers on graphite |
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