Vernier fringe‐counting device for laser wavelength measurements

A vernier fringe‐counting circuit designed for use with a Kowalski‐type wavemeter is described. Wavelength measurements made with this device have a high reproducibility of 5×10− 9 (or 1/50 of a fringe) and measured accuracy of 4×10− 9. The results of accuracy tests are presented along with systemat...

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Veröffentlicht in:	Review of scientific instruments 1983-09, Vol.54 (9), p.1138-1142
Hauptverfasser:	Kahane, A., O’Sullivan, M. S., Sanford, N. M., Stoicheff, B. P.
Format:	Artikel
Sprache:	eng
Schlagworte:	Design of specific laser systems Exact sciences and technology Fundamental areas of phenomenology (including applications) Laser optical systems: design and operation Optics Physics
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Beschreibung
Zusammenfassung:	A vernier fringe‐counting circuit designed for use with a Kowalski‐type wavemeter is described. Wavelength measurements made with this device have a high reproducibility of 5×10− 9 (or 1/50 of a fringe) and measured accuracy of 4×10− 9. The results of accuracy tests are presented along with systematic errors incurred when the wavelengths of two He–Ne lasers (632.9 nm) are compared by the vernier method.
ISSN:	0034-6748 1089-7623
DOI:	10.1063/1.1137537