Improved method for measuring tunneling conductance

an improved electronic circuit has been used to measure tunneling conductance, d I/d V, and its derivative, d 2 I/d V 2 as a function of applied voltage for superconducting junctions. The configuration described permits four‐terminal measurements. A harmonic excitation voltage applied to the sample...

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Veröffentlicht in:Review of scientific instruments 1980-10, Vol.51 (10), p.1411-1412
Hauptverfasser: Flesner, L. D., Silver, A. H.
Format: Artikel
Sprache:eng
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Zusammenfassung:an improved electronic circuit has been used to measure tunneling conductance, d I/d V, and its derivative, d 2 I/d V 2 as a function of applied voltage for superconducting junctions. The configuration described permits four‐terminal measurements. A harmonic excitation voltage applied to the sample has low noise (
ISSN:0034-6748
1089-7623
DOI:10.1063/1.1136085