Improved method for measuring tunneling conductance
an improved electronic circuit has been used to measure tunneling conductance, d I/d V, and its derivative, d 2 I/d V 2 as a function of applied voltage for superconducting junctions. The configuration described permits four‐terminal measurements. A harmonic excitation voltage applied to the sample...
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Veröffentlicht in: | Review of scientific instruments 1980-10, Vol.51 (10), p.1411-1412 |
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Hauptverfasser: | , |
Format: | Artikel |
Sprache: | eng |
Online-Zugang: | Volltext |
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Zusammenfassung: | an improved electronic circuit has been used to measure tunneling conductance, d
I/d
V, and its derivative, d
2
I/d
V
2 as a function of applied voltage for superconducting junctions. The configuration described permits four‐terminal measurements. A harmonic excitation voltage applied to the sample has low noise ( |
---|---|
ISSN: | 0034-6748 1089-7623 |
DOI: | 10.1063/1.1136085 |