Current gain increase in AlGaAs/GaAs heterojunction bipolar transistors using AlGaAs layer overgrowth
Reduction of the surface recombination current components in Npn AlGaAs/GaAs heterojunction bipolar transistors has been achieved by overgrowing the emitter-mesas with an AlGaAs layer approximately 0.5 μm thick. It was observed that the n=2 recombination current was reduced by ∼90%, to about 10% of...
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Veröffentlicht in: | Applied physics letters 1994-09, Vol.65 (11), p.1403-1405 |
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Hauptverfasser: | , , , |
Format: | Artikel |
Sprache: | eng |
Online-Zugang: | Volltext |
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Zusammenfassung: | Reduction of the surface recombination current components in Npn AlGaAs/GaAs heterojunction bipolar transistors has been achieved by overgrowing the emitter-mesas with an AlGaAs layer approximately 0.5 μm thick. It was observed that the n=2 recombination current was reduced by ∼90%, to about 10% of the original value, with a corresponding 13-fold increase in current gain for 270×20 μm2 devices. In addition, devices with the same emitter-base area, but significantly different perimeters, were observed to have similar current gains and n=2 recombination current values. This was in contrast to devices fabricated without an overgrowth layer. These results suggest that the overgrowth layer causes a very significant reduction in the perimeter recombination current. |
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ISSN: | 0003-6951 1077-3118 |
DOI: | 10.1063/1.112065 |