Current gain increase in AlGaAs/GaAs heterojunction bipolar transistors using AlGaAs layer overgrowth

Reduction of the surface recombination current components in Npn AlGaAs/GaAs heterojunction bipolar transistors has been achieved by overgrowing the emitter-mesas with an AlGaAs layer approximately 0.5 μm thick. It was observed that the n=2 recombination current was reduced by ∼90%, to about 10% of...

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Veröffentlicht in:Applied physics letters 1994-09, Vol.65 (11), p.1403-1405
Hauptverfasser: Kalingamudali, S. R. D., Wismayer, A. C., Woods, R. C., Roberts, J. S.
Format: Artikel
Sprache:eng
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Zusammenfassung:Reduction of the surface recombination current components in Npn AlGaAs/GaAs heterojunction bipolar transistors has been achieved by overgrowing the emitter-mesas with an AlGaAs layer approximately 0.5 μm thick. It was observed that the n=2 recombination current was reduced by ∼90%, to about 10% of the original value, with a corresponding 13-fold increase in current gain for 270×20 μm2 devices. In addition, devices with the same emitter-base area, but significantly different perimeters, were observed to have similar current gains and n=2 recombination current values. This was in contrast to devices fabricated without an overgrowth layer. These results suggest that the overgrowth layer causes a very significant reduction in the perimeter recombination current.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.112065