Evidence for hydrogen accumulation at strained layer heterojunctions

The incorporation of hydrogen into strained InxGa1−xAs/GaAs quantum wells results in the formation of shallow, H-related radiative states which compete with, and quench, the intrinsic band-to-band luminescence. By comparing the photoluminescence data obtained from hydrogenated material with secondar...

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Veröffentlicht in:Applied physics letters 1993-08, Vol.63 (7), p.926-928
Hauptverfasser: SOBIESIERSKI, Z, CLEGG, J. B
Format: Artikel
Sprache:eng
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Zusammenfassung:The incorporation of hydrogen into strained InxGa1−xAs/GaAs quantum wells results in the formation of shallow, H-related radiative states which compete with, and quench, the intrinsic band-to-band luminescence. By comparing the photoluminescence data obtained from hydrogenated material with secondary ion mass spectroscopy profiles from deuterated material, it is possible to deduce that the H-related radiative states are associated with H which is accumulated at the well interfaces.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.110775