Interfacial alloy formation in ZnSe/CdSe quantum-well heterostructures characterized by photoluminescence spectroscopy

The interface of a binary single quantum-well (SQW) structure of ZnSe/CdSe, where CdSe less than one monolayer is sandwiched by ZnSe layers (submonolayer SQW), is characterized by photoluminescence spectroscopy. The dependence of the energy, linewidth, and intensity of excitonic emission from submon...

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Veröffentlicht in:	Applied physics letters 1993-09, Vol.63 (12), p.1678-1680
Hauptverfasser:	ZIQIANG ZHU, YOSHIHARA, H, TAKEBAYASHI, K, YAO, T
Format:	Artikel
Sprache:	eng
Schlagworte:	Collective excitations (including excitons, polarons, plasmons and other charge-density excitations) Collective excitations (including plasmons and other charge-density excitations) Condensed matter: electronic structure, electrical, magnetic, and optical properties Condensed matter: structure, mechanical and thermal properties Electron states Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures Exact sciences and technology Excitons and related phenomena Ii-vi semiconductors Low-dimensional structures (superlattices, quantum well structures, multilayers): structure, and nonelectronic properties Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation Photoluminescence Physics Surface and interface electron states Surfaces and interfaces thin films and whiskers (structure and nonelectronic properties)
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Zusammenfassung:	The interface of a binary single quantum-well (SQW) structure of ZnSe/CdSe, where CdSe less than one monolayer is sandwiched by ZnSe layers (submonolayer SQW), is characterized by photoluminescence spectroscopy. The dependence of the energy, linewidth, and intensity of excitonic emission from submonolayer SQWs on the well thickness of CdSe is extensively investigated. The characteristics of the excitonic emission are interpreted in terms of alloy formation at the interface.
ISSN:	0003-6951 1077-3118
DOI:	10.1063/1.110708