Nanosize structures connectivity in porous silicon and its relation to photoluminescence efficiency

Transmission electron microscopy is used to reveal the existence of an interconnected nanosize structure in porous silicon films. The interconnections of this nanostructure determine the photoexcited electron-hole pair separation and consequently the luminescence efficiency of the material. Efficien...

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Veröffentlicht in:Applied physics letters 1993-10, Vol.63 (14), p.1927-1929
Hauptverfasser: TESCHKE, O, ALVAREZ, F, TESSLER, L, KLEINKE, M. U
Format: Artikel
Sprache:eng
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Zusammenfassung:Transmission electron microscopy is used to reveal the existence of an interconnected nanosize structure in porous silicon films. The interconnections of this nanostructure determine the photoexcited electron-hole pair separation and consequently the luminescence efficiency of the material. Efficient photoluminescence is obtained from structures which shows no connectivity.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.110651