Relationship among reflectance-difference spectroscopy, surface photoabsorption, and spectroellipsometry

From the reflectance expressions for a thin biaxial layer on an isotropic substrate we relate reflectance-difference spectroscopy (RDS), surface photoabsorption (SPA), and spectroellipsometry. Using these results and our recently acquired RD database, we determine surface reconstructions present dur...

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Veröffentlicht in:	Applied physics letters 1993-08, Vol.63 (7), p.885-887
Hauptverfasser:	HINGERL, K, ASPNES, D. E, KAMIYA, I, FLOREZ, L. T
Format:	Artikel
Sprache:	eng
Schlagworte:	Exact sciences and technology Infrared, submillimeter wave, microwave and radiowave instruments, equipment and techniques Instruments, apparatus, components and techniques common to several branches of physics and astronomy Physics
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Zusammenfassung:	From the reflectance expressions for a thin biaxial layer on an isotropic substrate we relate reflectance-difference spectroscopy (RDS), surface photoabsorption (SPA), and spectroellipsometry. Using these results and our recently acquired RD database, we determine surface reconstructions present during flow-modulated organometallic chemical vapor growth of epitaxial GaAs from SPA data that were published by others.
ISSN:	0003-6951 1077-3118
DOI:	10.1063/1.109890