Domain inversion in KTiOPO4 using electron beam scanning
Domain inversion in c-cut KTiOPO4 was produced by scanning an electron beam on the −c face. The domain reversal occurred through the 1 mm thickness of the sample. Second-harmonic conversion efficiency of 7×10−5 was measured for a fifth-order grating by focusing the beam to a 7 μm spot in a 500-μm-lo...
Gespeichert in:
Veröffentlicht in: | Applied physics letters 1993-08, Vol.63 (9), p.1167-1169 |
---|---|
Hauptverfasser: | , , , |
Format: | Artikel |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | Domain inversion in c-cut KTiOPO4 was produced by scanning an electron beam on the −c face. The domain reversal occurred through the 1 mm thickness of the sample. Second-harmonic conversion efficiency of 7×10−5 was measured for a fifth-order grating by focusing the beam to a 7 μm spot in a 500-μm-long domain-inverted KTP crystal. This efficiency is close to the theoretical value of 9×10−5. The measured phase matching bandwidth was 1.9 nm, which is in agreement with the theoretical value of 1.5 nm indicating that the domain-inverted grating is reasonably uniform over its entire length. |
---|---|
ISSN: | 0003-6951 1077-3118 |
DOI: | 10.1063/1.109811 |