Domain inversion in KTiOPO4 using electron beam scanning

Domain inversion in c-cut KTiOPO4 was produced by scanning an electron beam on the −c face. The domain reversal occurred through the 1 mm thickness of the sample. Second-harmonic conversion efficiency of 7×10−5 was measured for a fifth-order grating by focusing the beam to a 7 μm spot in a 500-μm-lo...

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Veröffentlicht in:Applied physics letters 1993-08, Vol.63 (9), p.1167-1169
Hauptverfasser: GUPTA, M. C, RISK, W. P, NUTT, A. C. G, LAU, S. D
Format: Artikel
Sprache:eng
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Zusammenfassung:Domain inversion in c-cut KTiOPO4 was produced by scanning an electron beam on the −c face. The domain reversal occurred through the 1 mm thickness of the sample. Second-harmonic conversion efficiency of 7×10−5 was measured for a fifth-order grating by focusing the beam to a 7 μm spot in a 500-μm-long domain-inverted KTP crystal. This efficiency is close to the theoretical value of 9×10−5. The measured phase matching bandwidth was 1.9 nm, which is in agreement with the theoretical value of 1.5 nm indicating that the domain-inverted grating is reasonably uniform over its entire length.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.109811